Nano-imaging using Atomic force microscopy

Last updated 11th Jul 2017
Follow pinboard

CURATOR

A pinboard by Jingjing Jiang

Graduate Research Assistant, California Institute of Technology

PINBOARD SUMMARY

Atomic force microscopy (AFM) can "see" the surface of samples on a nanometer scale. It can also simultaneously measure electrical and mechanical properties of the sample. The system has a ...

4 ITEMS PINNED

#1
Tribology. Mechanisms of antiwear tribofilm growth revealed in situ by single-asperity sliding contacts.
Research published 15th Mar 2015 in Science
Pinned 11th Jul 2017
#2
Superlubricity of graphene nanoribbons on gold surfaces.
Research published 27th Feb 2016 in Science
Pinned 11th Jul 2017
#3
Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoe...
Research published 1st Feb 2017 in Nanotechnology
Pinned 11th Jul 2017
#4
Nanoelectrical and Nanoelectrochemical Imaging of Pt/p-Si and Pt/p+-Si Electrodes.
Research published 22nd Jun 2017 in ChemSusChem
Pinned 11th Jul 2017
Followers (0)
Share
Pinboard URL (click to copy)
Embed on website (click to copy)