Indexed on: 10 Mar '16Published on: 10 Mar '16Published in: Journal of Materials Science: Materials in Electronics
Lead-free (1−x)Ba0.8Ca0.2TiO3–xBi(Mg0.5Zr0.5)O3 [(1−x)BCT–xBMZ, 0 ≤ x ≤ 0.3] ceramics were fabricated via a conventional solid-state reaction method. The structure and dielectric properties of BCT–BMZ ceramics were systematically investigated. X-ray diffraction patterns and Raman spectra show that a systematically structural change form a tetragonal to pseudo-cubic phase occurred at about x = 0.06–0.08. As x values increased to 0.3, the temperature stability of permittivity of ceramics was markedly increased (Δε/ε 27 °C ≤ ±15 %) and low dielectric loss (≤2 %) was obtained over a wide temperature range from 27 to 290 °C at 1 kHz. These results indicate that (1−x)BCT–xBMZ ceramics are promising candidates for thermally stabile devices.