Quantcast

Substrate coated with an MgO layer

Imported: 24 Feb '17 | Published: 13 Jan '04

Johannes Stollenwerk, Christoph Daube, Achim Gürke

USPTO - Utility Patents

Abstract

A method for manufacturing a display panel substrate has the steps of flowing a working gas along and out of a slit defined between two sputtering targets of Mg and toward the substrate thereby selecting the purity of the Mg material of the targets to be at least 99% and thereby blowing sputtered-off material out of the slit and toward the substrate. Introduction, in an area between the slit and the substrate, of a reactive gas containing oxygen, follows, and reacting the sputtered-off material with the reactive gas results in depositing on the substrate, an MgO layer. The method also includes setting the temperature of the substrate during the coating process.

Description

SHORT DESCRIPTION OF THE FIGURES

The invention is further described by way of examples and with the help of figures.

These figures show:

FIG. 1 schematically an inventive apparatus for performing the inventive manufacturing process and for realizing the inventive substrate;

FIG. 2 the -2-method diagram with predominant peaks at (111) and (200) respectively of an inventive substrate produced according to the inventive method and preferably thereby with the inventive apparatus and for a varied oxygen flow;

FIG. 3 in a representation in analogy to that of FIG. 2, the setting of the peaks by varying the substrate temperature T prevailing during the inventive coating;

FIG. 4 in a representation in analogy to FIG. 2, the peak at an inventive substrate (b) and at a polycrystalline MgO-powder (a), latter for comparison;

FIG. 5 the absorption coefficient as a function of wavelength of the impinging light of an inventive substrate, manufactured according to the inventive method and, preferably, with an inventive apparatus;

FIG. 6 the index of refraction n as a function of wavelength of the impinging light of an inventive substrate according to FIG. 5;

FIG. 7 the spectral transmission in percent for an AF 45 glass (a), for comparison, and of an inventive substrate which comprises AF 45 glass as carrier substrate;

FIG. 8 along a plane E as shown in FIG. 1, the distribution of deposited layer material, whereby the substrate is kept stationary with respect to the coating source and indicated in percent of the maximum deposition thickness along the substrate;

FIG. 9 on an inventive PDP-substrate, the distribution of MgO-coating thickness;

FIG. 10 at an inventive substrate, coated at a substrate temperature T=200° C., the surface roughness measured by means of Atomic Force Microscopy (AFM).

Claims

1. A method for manufacturing a display panel substrate comprising the steps of:

2. The method of claim 1, wherein said substrate is a substrate of a plasma display panel.

3. The method of claim 1, further comprising the step of providing the possibility of introducing into said reactive gas hydrogen and introducing hydrogen with an amount of 0% to 50% into said reactive gas with respect to the total amount of reactive gas introduced.

4. The method of claim 3, further comprising the step of introducing said hydrogen into said reactive gas with an amount of 0% to 10% with respect to the total amount of reactive gas introduced.

5. The method of claim 1, further comprising the step of providing the possibility of introducing hydrogen gas into said reactive gas and controlling the surface roughness of said MgO layer by controlling the amount of hydrogen gas introduced into said reactive gas.

6. The method of claim 1, further comprising the step of providing the possibility of introducing hydrogen gas into said reactive gas and controlling the crystal structure of the MgO layer by controlling the amount of hydrogen gas introduced into said reactive gas.

7. The method of claim 1, further comprising the step of depositing said MgO layer with a density being at least 90% of the density of stoichiometric MgO bulk material, which is =3.58 g/cm3.

8. The method of claim 1, further comprising the step of depositing said MgO layer with a predominant peak at (200) and/or at (220) and/or at (111), in a -2-method measuring diagram.

9. The method of claim 1, further comprising the step of depositing said MgO with a predominant peak at (111) in a -2-method measuring diagram.

10. The method of claim 9, wherein said peak is the only predominant peak.

11. The method of claim 10, further comprising the step of depositing said MgO layer with an index of refraction n for a spectral range of light of at least 400 nm to 800 nm, which is 1.5≦n≦1.8.

12. The method of claim 1, further comprising the step of depositing said MgO layer with an index of refraction n for a spectral range of light of at least 400 nm to 800 nm which is: 1.59≦n≦1.75.

13. The method of claim 12, wherein said range is at least 350 nm to 820 nm.

14. The method of claim 1, further comprising the step of depositing said MgO layer with a thickness of between 200 nm and 800 nm.

15. The method of claim 1, further comprising the step of depositing said MgO layer with a surface roughness which is homogeneously distributed along said substrate and which is in the range of 0.5 nm RMS to 18 nm RMS, measured by means of an atomic force microscope.

16. The method of claim 1, further comprising the step of depositing said MgO layer comprising stoichiometric MgO.

17. The method of claim 1, further comprising the step of adjusting at least one of an angular position and of an extent of peaks at a resulting diagram of a -2-method by adjusting at least one of the amount of reactive gas introduced per time unit, and of said substrate temperature.

18. The method of claim 1, further comprising the step of selecting a static deposition rate r

s of said MgO layer to be at least 5 nm/sec.

19. The method of claim 18, further comprising the step of selecting said static deposition rate to be at least 10 nm/sec.

20. The method of claim 1, further comprising the step of moving said substrate distant and along said slit during said deposition.

21. The method of claim 20, further comprising the step of selecting said moving to be linearly and with a constant speed.

22. The method of claim 20, further comprising the step of selecting a dynamic deposition rate of a least 30 nm*m/min.

23. The method of claim 22, thereby selecting said dynamic deposition rate to be at least 52 nm*m/min.

24. The method of claim 1, further comprising the step of adding to said reactive gas hydrogen and premixing said oxygen and hydrogen in a tank arrangement, thereby feeding said reactive gas from said tank arrangement.

25. The method of claim 1, further comprising the step of selecting total pressure adjacent said substrate to be:

26. The method of claim 1, further comprising the step of selecting the partial pressure of said reactive gas adjacent to said substrate to be up to 10% of the total pressure.

27. The method of claim 1, further comprising the step of selecting the flow of working gas through said slit to be within a Knudsen or viscose range.

28. The method of claim 1, further comprising the step of selecting the flow F of working gas per surface area of said slit opening out and towards said substrate to be:

29. The method of claim 1, further comprising the step of selecting the width of said slit at its end pointing towards said substrate, , to be: 5 mm≦≦40 mm.

30. The method of claim 1, further comprising the step of selecting the depth of said slit H

s to be: 1 cm≦H

s≦20 cm.

31. The method of claim 1, further comprising the step of coating substrates of at least an extent of 100 mm×100 mm.

32. The method of claim 1, further comprising the step of coating substrates with in extent of 300 mm×400 mm.

33. The method of claim 32, further comprising the step of coating said substrates with a thickness distribution of at least ±10% with respect to a layer thickness average value.

34. The method of claim 1, further comprising the step of selecting said temperature to be 200° C.

35. The method of claim 1, further comprising the step of exploiting said targets to at least 70%.

36. The method of claim 1, further comprising the step of performing said sputtering by magnetron sputtering.

37. The method of claim 36, further comprising the step of applying a magnetic field H to said targets, so that in the middle of the said slit: 150 Gauss≦H≦1200 Gauss.

38. The method of claim 1, wherein said temperature is open looped or negative feedback controlled.

39. A method for manufacturing a display panel substrate comprising the steps of:

40. The method of claim 39, wherein said substrate is a substrate of a plasma display panel.

41. The method of claim 39, further comprising the step of providing the possibility of introducing into said reactive gas hydrogen and introducing hydrogen with an amount of 0% to 50% into said reactive gas with respect to the total amount of reactive gas introduced.

42. The method of claim 41, further comprising the step of introducing said hydrogen into said reactive gas with an amount of 0% to 10% with respect to the total amount of reactive gas introduced.

43. The method of claim 39, further comprising the step of providing the possibility of introducing hydrogen gas into said reactive gas and controlling the surface roughness of said MgO layer by controlling the amount of hydrogen gas introduced into said reactive gas.

44. The method of claim 39, further comprising the step of providing the possibility of introducing hydrogen gas into said reactive gas and controlling the crystal structure of the MgO layer by controlling the amount of hydrogen gas introduced into said reactive gas.

45. The method of claim 39, further comprising the step of depositing said MgO layer with a density being at least 90% of the density of stoichiometric MgO bulk material, which is =3.58 g/cm3.

46. The method of claim 39, further comprising the step of depositing said MgO layer with a predominant peak at (200) and/or at (220) and/or at (111), in a -2-method measuring diagram.

47. The method of claim 39, further comprising the step of depositing said MgO layer with an index of refraction n for a spectral range of light of at least 400 nm to 800 nm, which is 1.5≦n≦1.8.

48. The method of claim 39, further comprising the step of depositing said MgO layer with an index of refraction n for a spectral range of light of at least 400 nm to 800 nm which is:

49. The method of claim 48, wherein said range is at least 350 nm to 820 nm.

50. The method of claim 39, further comprising the step of depositing said Mgo layer with a thickness of between 200 nm and 800 nm.

51. The method of claim 39, further comprising the step of depositing said MgO layer with a surface roughness which is homogeneously distributed along said substrate and which is in the range of 0.5 nm RMS to 18 nm RMS, measured by means of an atomic force microscope.

52. The method of claim 39, further comprising the step of depositing said MgO layer comprising stoichiometric MgO.

53. The method of claim 39, further comprising the step of adjusting at least one of an angular position and of an extent of peaks at a resulting diagram of a -2-method by adjusting at least one of the amount of reactive gas introduced per time unit, and of said substrate temperature.

54. The method of claim 39, further comprising the step of selecting a static deposition rate r

s of said MgO layer to be at least 5 nm/sec.

55. The method of claim 54, further comprising the step of selecting said static deposition rate to be at least 10 nm/sec.

56. The method of claim 39, further comprising the step of moving said substrate distant and along said slit during said deposition.

57. The method of claim 56, further comprising the step of selecting said moving to be linearly and with a constant speed.

58. The method of claim 56, further comprising the step of selecting a dynamic deposition rate of a least 30 nm*m/min.

59. The method of claim 58, thereby selecting said dynamic deposition rate to be at least 52 nm*m/min.

60. The method of claim 39, further comprising the step of adding to said reactive gas hydrogen and premixing said oxygen and hydrogen in a tank arrangement, thereby feeding said reactive gas from said tank arrangement.

61. The method of claim 39, further comprising the step of selecting total pressure adjacent said substrate to be:

62. The method of claim 39, further comprising the step of selecting the partial pressure of said reactive gas adjacent to said substrate to be up to 10% of the total pressure.

63. The method of claim 39, further comprising the step of selecting the flow of working gas through said slit to be within a Knudsen or viscose range.

64. The method of claim 39, further comprising the step of selecting the flow F of working gas per surface area of said slit opening out and towards said substrate to be:

65. The method of claim 39, further comprising the step of selecting the width of said slit at its end pointing towards said substrate, , to be: 5 mm≦≦40 mm.

66. The method of claim 39, further comprising the step of selecting the depth of said slit H

s to be: 1 cm≦H

s≦20 cm.

67. The method of claim 39, further comprising the step of coating substrates of at least an extent of 100 mm×100 mm.

68. The method of claim 39, further comprising the step of coating substrates with in extent of 300 mm×400 mm.

69. The method of claim 68, further comprising the step of coating said substrates with a thickness distribution of at least ±10% with respect to a layer thickness average value.

70. The method of claim 39, further comprising the step of selecting said temperature to be 200° C.

71. The method of claim 39, further comprising the step of exploiting said targets to at least 70%.

72. The method of claim 39, further comprising the step of performing said sputtering by magnetron sputtering.

73. The method of claim 72, further comprising the step of applying a magnetic field H to said targets, so that in the middle of the said slit: 150 Gauss≦H≦1200 Gauss.

74. The method of claim 39, wherein said temperature is open looped or negative feedback controlled.

75. A method for manufacturing a display panel substrate comprising the steps of:

76. A method for manufacturing a display panel substrate comprising the steps of:

77. A method for manufacturing a display panel substrate comprising the steps of:

78. A method for manufacturing a display panel substrate comprising the steps of:

79. A method for manufacturing a display panel substrate comprising the steps of:

80. A method for manufacturing a display panel substrate comprising the steps of: