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Structure and scintillation properties of CsI(Tl) films on Si single crystal substrates

Research paper by Lina Guo, Shuang Liu, Dejun Chen, Shangjian Zhang, Yong Liu, Zhiyong Zhong, Charles M. Falco

Indexed on: 23 Apr '16Published on: 21 Apr '16Published in: Applied Surface Science



Abstract

CsI(Tl) scintillation films fabricated on glass substrates are widely applied for X-ray imaging because their ability to grow in micro-columnar structure and proper emission wavelength matching CCD cameras. But the coupling process between the CsI(Tl) films and Si-based photo detector would cause coupling loss. In this work, CsI(Tl) films were deposited on the orienting Si substrates and the Si substrates covered by the pre-deposited CsI nanolayers. Structure and scintillation properties of films were examined by using scanning electron microscopy, X-ray diffraction, photoluminescence and radioluminescent spectrum. The films deposited on the orienting Si substrates show the micro-columnar morphology with perfect single crystalline structure and the photoluminescence spectra with bimodal distribution. The performances of the films prepared on the pre-deposited CsI nanolayer, containing micro-columns structure and the light yield are improved.