Indexed on: 07 Feb '14Published on: 07 Feb '14Published in: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
The patterns of change in the structure and the phase composition of chromium-fullerite-chromium films subjected to heat treatment in vacuum at different temperatures (470, 570, and 620 K) are studied via scanning electron and atomic force microscopies, X-ray diffraction, reflection-electron diffraction, and X-ray spectral microanalysis. It is found that sample annealing at 470 and 570 K leads to recrystallization of the fullerite and the emergence and growth of a new CrxC60 phase, accompanied by volumetric changes that generate internal mechanical stresses. During the process of stress relaxation, the film starts to crack, and lamellar crystallites of the fullerite phase start to grow. Film destruction and the growth of C60 crystallites on the surface are not observed in chromium-fullerite-chromium films annealed at 620 K.