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Spectroscopic ellipsometry and electrical characterizations of InGaAs:Mg thin films lattice matched to InP

Research paper by I. Zeydi, M. Ezzedini, A. Sayari, E. Shalaan, S. Wageh, L. Sfaxi, A. A. Al-Ghamdi, R. M’Gaieth

Indexed on: 08 Jun '16Published on: 09 Jun '16Published in: The European Physical Journal Plus



Abstract

Mg-doped InGaAs films were grown at 560 ° C lattice matched to InP semi-insulating substrate by metalorganic vapor phase epitaxy (MOVPE) under various Cp2Mg flow conditions. Hall effect, photoluminescence (PL), high-resolution X-ray diffraction (HR-XRD) and spectroscopic ellipsometry (SE) are the tools used in this work. The crystalline quality and the n-p conversion of the InGaAs:Mg films are described and discussed in relation to the Cp2Mg flow. Distinguishing triple emissions peaks in PL spectra are observed and seem to be strongly dependent on the Cp2Mg flow. SE was used to investigate the interband transitions in InGaAs:Mg/InP heterointerfaces and the different critical point energies were identified.