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Semiconductor device

Imported: 25 Feb '17 | Published: 01 Jul '03

Akinori Sakurai, Hiromichi Nogawa

USPTO - Utility Patents

Abstract

The semiconductor device according to the present invention includes a semiconductor chip having a delay unit and a delay time measuring unit for measuring a delay time. The delay time measuring unit generates a measurement result signal, which is a digital signal, based on the delay time, and outputs the measurement result signal outside the semiconductor chip.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

The above-mentioned and other objects, features and advantages of this invention will become more apparent by reference to the following detailed description of the invention taken in conjunction with the accompanying drawings, wherein:

FIG. 1 shows the configurations of the semiconductor device and a tester

50 for measuring the delay time of a delay device

1 loaded into the semiconductor device according to the first embodiment of the present invention;

FIG. 2 shows the configuration of a semiconductor chip

10;

FIG. 3 shows the operation of a delay time identification circuit

22;

FIG. 4 shows the process of generating a counter value sum CSUM;

FIG. 5 shows another configuration of the semiconductor device according to the first embodiment of the present invention;

FIG. 6 shows a further configuration of the semiconductor device according to the first embodiment of the present invention;

FIG. 7 shows the configuration of the semiconductor device according to the second embodiment of the present invention;

FIG. 8 shows the configuration of a delay time identification circuit

22′; and

FIG. 9 shows the conventional semiconductor device.

Claims

1. A semiconductor device, comprising:

2. The semiconductor device according to claim 1, wherein

3. The semiconductor device according to claim 1, wherein:

4. The semiconductor device according to claim 1, wherein

5. The semiconductor device according to claim 4, wherein