Imported: 24 Feb '17 | Published: 24 Aug '04
USPTO - Utility Patents
A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase of the optical component using a scanning laser having a scanning step size and a modulation frequency
c) is a magnified detail portion of FIG.
a), and
d) is a magnified detail portion of FIG.
b).
FIG. a) is a graph of Fourier components of a DCFBG group delay ripple interacting with the 10 Gb/s signal centered at one wavelength and
b) is a graph of Fourier components of the group delay ripple of the same DCFBG interacting with the 10 Gb/s signal centered at another wavelength.
FIG. a) is a graph of comparison between simulated OSNR power penalty (bottom curves) and the test-bed measurement (upper curve) for a first sample and
b) is a graph of comparison between simulated OSNR power penalty (bottom curves) and the test-bed measurement (upper curve) for a second sample.
1. A method for screening the quality of an optical component, the method comprising the steps of:
H()=
R() exp[
j()], and
2. The method of
3. The method of
4. The method of
5. The method of
6. The method of
7. A method for simulating the performance of the optical component, the method comprising the steps of:
H()=
R() exp[
j()], and
8. The method of
9. The method of
10. The method of
11. The method of
12. The method of