Quantcast

Programmable connector

Imported: 23 Feb '17 | Published: 22 Oct '02

Peter P. Cuevas

USPTO - Utility Patents

Abstract

A programmable connector for use with a burn-in tester for manufactured integrated circuits is provided with an array of programming regions which can be selectively activated and deactivated to accommodate a specific testing configuration depending on the type of IC being tested and on the type of test being performed. The activation process is achieved using a conductive solution, applied selectively to the programming regions from a hand-held pen-type implement. The solution dries following application and serves to close a circuit between two electrically isolated conductive portions of the programming region. The solution is removable, using a solvent or other material, deactivation of the programming region for re-configuring the programmable connector.

Description

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING(S)

Many advantages of the present invention will be apparent to those skilled in the art with a reading of this specification in conjunction with the attached drawings, wherein like reference numerals are applied to like elements and wherein:

FIG. 1 is a schematic drawing showing a prior art programmable connector;

FIG. 2 is a schematic drawing showing a testing system in accordance with the invention;

FIG. 3 is an isometric, partial cut-away view of a programmable connector in accordance with the invention;

FIG. 4A is a top plan view of a pair of programming regions in accordance with the invention;

FIG. 4B is a cross-sectional view taken along line

4B—

4B of

4A;

FIG. 5 is a top plan view of a pair of programming regions in which an one programming region is activated in accordance with the invention;

FIG. 6 is a schematic view showing a shared pad arrangement in accordance with the invention; and

FIG. 7 is a schematic view showing a dedicated pad arrangement in accordance with the invention.

Claims

1. A programmable connector for selectively connecting a device under test to a burn-in tester, the programmable connector being adapted to withstand clevated burn-in testing temperatures and comprising:

2. The programmable connector of claim 1, further comprising a first trace in electrical contact with either one of the device under test and the burn-in tester and a second trace in electrical contact with the other of the device under test and the burn-in tester, wherein the first conductive portion of at least one programming region is in electrical contact with the first trace and the second conductive portion of the at least one programming region is in electrical contact with the second trace.

3. The programmable connector of claim 2, further comprising a pad in electrical contact with the second conductive portion and the second trace.

4. The programmable connector of claim 3, further comprising a via for establishing the electrical contact between the pad and the second trace.

5. The programmable connector of claim 3, wherein the pad is in electrical contact with the second conductive portion of more than one programming region.

6. The programmable connector of claim 1, wherein the first and second portions of the programming region comprise confronting markings separated by the support region and disposed on a first surface of a printed circuit board.

7. The programmable connector of claim 1, wherein the support region is of non-conducting material.

8. The programmable connector of claim 1, wherein the conductive solution dries following application at the support region.

9. A testing system for selectively connecting a burn-in tester to a device under test, the testing system comprising:

10. The testing system of claim 9, further comprising a dispenser for dispensing the conductive solution onto the support region.

11. The testing system of claim 9, wherein the conductive solution dries following application at the support region.

12. A method for selectively routing electrical signals between a device under test and a burn-in tester used in burn-in testing under elevated temperature conditions, the method comprising:

13. The method of claim 12, further comprising the step of achieving a second routing configuration different from the first routing configuration by activating at least one programming region different from a programming region of the first configuration.

14. The method of claim 12, further comprising the step of achieving a second routing configuration different from the first routing configuration by deactivating at least one activated programming region, the step of deactivating comprising removing the conductive solution between the first and second conductive portions.

15. The method of claim 14, wherein the step of deactivating comprises applying a solvent to the conductive solution.

16. The method of claim 15, wherein the solvent is applied using a pen-type dispenser.

17. The method of claim 12, wherein the step of causing a programming region to become activated comprises applying conductive ink from a pen-type device to thereby connect the first and second portions.

18. The method of claim 17, wherein the conductive ink is visible.

19. The method of claim 18, wherein the conductive ink dries in place after application.