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Percolation in models of thin film depositions.

Research paper by N I NI Lebovka, S S SS Manna, S S Tarafdar, N N Teslenko

Indexed on: 07 Jan '03Published on: 07 Jan '03Published in: Physical review. E, Statistical, nonlinear, and soft matter physics



Abstract

We have studied the percolation behavior of deposits for different (2+1)-dimensional models of surface layer formation. The mixed model of deposition was used, where particles were deposited selectively according to the random (RD) and ballistic (BD) deposition rules. In the mixed one-component models with deposition of only conducting particles, the mean height of the percolation layer (measured in monolayers) grows continuously from 0.898 32 for the pure RD model to 2.605 for the pure BD model, but the percolation transition belongs to the same universality class, as in the two-dimensional (2D) random percolation problem. In two-component models with deposition of conducting and isolating particles, the percolation layer height approaches infinity as concentration of the isolating particles becomes higher than some critical value. The crossover transition from 2D to 3D percolation was observed with increase of the percolation layer height.