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Optical characteristics of 1.18-eV luminescence band complexes in n-GaAs:Sn(Si): Results of a photoluminescence study with polarized resonant excitation

Research paper by A. A. Gutkin, M. A. Reshchikov, V. E. Sedov, T. Piotrowski, J. Pultorak

Indexed on: 01 Jan '98Published on: 01 Jan '98Published in: Semiconductors



Abstract

Experimental values of the polarization of the low-temperature luminescence from the VGaSnGa and VGaSiGa complexes in n-GaAs under conditions of resonant excitation by polarized light propagating along the [110] or [100] crystal axis are compared with expressions obtained in the classical dipole approximation for defects with triclinic or monoclinic symmetry. It is shown that the rotator fraction in the superposition of rotator and oscillator contributions to the emission of the complexes is 17–18%. The direction of the axis of these dipoles, which matches the experimental data, is consistent with the assumption that the effect of the donor on the vacancy orbitals of a hole localized in the complex is lower than that of the Jahn-Teller effect. The resulting symmetry of the complex may be monoclinic or triclinic. In either case, deviation of the optical dipole axis of the complex from the dipole axis of an isolated VGa vacancy distorted as a result of the Jahn-Teller effect is lower for the VGaSnGa and VGaSiGa complexes than for VGaTeAs complexes. This means that the effect of the donor on the electron structure of the VGaTeAs complexes is greater than in the VGaSnGa and VGaSiGa complexes. This correlates with the difference in the donor position in these complexes.