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Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead

Research paper by Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee

Indexed on: 26 Oct '10Published on: 26 Oct '10Published in: Journal of Electronic Testing



Abstract

A compression-decompression scheme, Modified Selective Huffman (MS-Huffman) scheme based on Huffman code is proposed in this paper. This scheme aims at optimization of the parameters that influence the test cost reduction: the compression ratio, on-chip decoder area overhead and overall test application time. Theoretically, it is proved that the proposed scheme gives the better test data compression compared to very recently proposed encoding schemes for any test set. It is clearly demonstrated with a large number of experimental results that the proposed scheme improves the test data compression, reduces overall test application time and on-chip area overhead compared to other Huffman code based schemes.