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Mass analysis apparatus and method for mass analysis

Imported: 23 Feb '17 | Published: 22 Oct '02

Yoshiaki Kato

USPTO - Utility Patents

Abstract

A mass analysis apparatus is capable of performing a plurality of measurements in parallel by mounting a plurality of ion sources onto one mass spectrometer and speedily switching the ion sources. The mass analysis apparatus comprises a plurality of ion sources; and a deflecting means for deflecting ions from at least one ion source among the plurality of ion sources so that the ions travel toward the mass spectrometer by producing an electric field.

Description

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a block diagram showing the basic configuration of a first embodiment of an atmospheric pressure ionization LC/MS in accordance with the present invention.

FIG. 2 is a view explaining an electrostatic deflector.

FIG. 3 is a view showing an outward appearance of the first embodiment in accordance with the present invention.

FIG. 4 is a schematic view showing the internal configuration of the first embodiment in accordance with the present invention.

FIG. 5 is a view showing an example of a circular electrostatic deflector mounting four ion sources.

FIG. 6 is a view showing an example of a polygonal electrostatic deflector mounting four ion sources.

FIG. 7 is a view illustrating a feature of ion deflection in the structure of FIG.

5.

FIG. 8 is a view illustrating a feature of ion deflection in the structure of FIG.

5.

FIG. 9 is a view illustrating a feature of ion deflection in the structure of FIG.

5.

FIG. 10 is a view explaining the relationship between acceleration voltage of the ion acceleration electrode and electric field of the electrostatic deflector.

FIG. 11 is a chart explaining operation of obtaining an optimum applied voltage for the ion acceleration electrode.

FIG. 12 is a chart explaining operation of obtaining an optimum applied voltage for the electrostatic deflector.

FIG. 13 is a view explaining operation of the first embodiment.

FIG. 14 is a block diagram showing the configuration of a second embodiment.

FIG. 15 is a block diagram showing the configuration of a third embodiment.

FIG. 16 is a block diagram showing the configuration of a fourth embodiment.

FIG. 17 is a block diagram showing the configuration of a fifth embodiment.

FIG. 18 is a chart showing the measurement operation of a sixth embodiment.

FIG. 19 is a chart showing chromatogram when two ion sources are measured.

FIG. 20 is a chart showing an example of an output from a CRT or a printer.

FIG. 21 is a chart showing other measurement operation of the sixth embodiment.

FIG. 22 is a chart showing other measurement operation of the sixth embodiment.

FIG. 23 is a block diagram showing the configuration of a seventh embodiment.

FIG. 24 is a block diagram showing the configuration of an eighth embodiment.

FIG. 25 is a view showing the outer appearance of a quadrupole deflector.

FIG. 26 is a view explaining deflection of ions by the quadrupole deflector.

FIG. 27 is a view explaining deflection of ions by the quadrupole deflector.

FIG. 28 is a block diagram showing the configuration of a ninth embodiment.

FIG. 29 is a view explaining deflection of ions by the quadrupole deflector.

FIG. 30 is a view showing a detailed configuration of the ninth embodiment.

FIG. 31 is a block diagram showing a conventional example.

FIG. 32 is a block diagram showing a conventional example.

Claims

1. A mass analysis apparatus for performing mass analysis by introducing ions produced in an ion source into a mass spectrometer, which comprises:

2. A mass analysis apparatus according to claim 1, wherein

3. A mass analysis apparatus according to claim 2, which comprises

4. A mass analysis apparatus according to claim 1, wherein said two flat plate electrodes of said electrostatic deflector are arranged in parallel to each other and on an axis along which the ion beam is introduced into said mass spectrometer,

5. A mass analysis apparatus according to claim 4, wherein

6. A method for mass analysis using a mass analysis apparatus that includes:

7. A method for mass analysis according to claim 6, and further comprising:

8. A method for mass analysis according to claim 7, comprising:

9. A method for mass analysis according to claim 7, comprising:

10. A method for mass analysis using a mass analysis apparatus that includes:

11. A method for mass analysis using a mass analysis apparatus that includes:

12. A method of setting voltages applied to ion acceleration electrodes and an electrostatic deflector in a mass analysis apparatus which comprises:

13. A method of setting voltages applied to ion acceleration electrodes and an electrostatic deflector in a mass analysis apparatus which includes: