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Low-frequency critical current noise in graphene Josephson junctions in the open-circuit gate voltage limit

Research paper by Francesco M. D. Pellegrino, Giuseppe Falci, Elisabetta Paladino

Indexed on: 10 Nov '20Published on: 09 Nov '20Published in: arXiv - Physics - Mesoscopic Systems and Quantum Hall Effect



Abstract

We investigate critical current noise in short ballistic graphene Josephson junctions in the open-circuit gate-voltage limit within the McWorther model. We find flicker noise in a wide frequency range and discuss the temperature dependence of the noise amplitude as a function of the doping level. At the charge neutrality point we find a singular temperature dependence $T^{-3}$, strikingly different from the linear dependence expected for short ballistic graphene Josephson junctions under fixed gate voltage.