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Loaded-board, guided-probe test fixture

Imported: 23 Feb '17 | Published: 22 Oct '02

Tracy L. Sayre, Robert A. Slutz, Kris J. Kanack

USPTO - Utility Patents

Abstract

A test fixture for electrically connecting a limited-access test target on a loaded circuit board with an interface probe of a tester may comprise an elongate test probe having a first end and a second end and a wireless interface printed circuit board having a first side and a second side. The first end of the elongate test probe is substantially aligned with the limited-access target on the loaded circuit board when the test fixture is positioned adjacent the loaded circuit board. A contact pad on the first side of the wireless interface printed circuit board is substantially aligned with the elongate test probe so that the contact pad contacts the second end of the elongate test probe. A contact target on the second side of the wireless interface printed circuit board is electrically connected to the contact pad on the first side of the wireless interface printed circuit board. The contact target contacts the interface probe of the tester when the test fixture is mounted on the tester.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other objects, features and advantages of the present invention will be better understood by reading the following more particular description of the invention, presented in conjunction with the following drawings, wherein:

FIG. 1 shows a cut-away view of a conventional shortwire test fixture;

FIG. 2 shows a cut-away view of a conventional ultra-alignment test fixture;

FIG. 3 shows a cut-away view of a conventional guided-probe protection plate fixture;

FIG. 4 shows a cut-away view of a conventional bare-board translator test fixture;

FIG. 5 shows a cut-away view of first and second embodiments of a loaded-board, guided-probe test fixture according to the present invention;

FIG. 6 shows a cut-away view of a third embodiment of a loaded-board, guided-probe test fixture according to the present invention;

FIG. 7 shows a cut-away view of a fourth embodiment of a loaded-board, guided-probe test fixture with a wireless interface printed circuit board according to the present invention; and

FIG. 8 shows a cut-away view of fifth and sixth embodiments of a loaded-board, guided-probe test fixture with a universal interface plate according to the present invention.

Claims

1. A test fixture for electrically connecting a limited-access test target on a loaded circuit board with an interface probe of a tester, comprising:

2. The test fixture of claim 1, further comprising a plurality of guide plates positioned in generally parallel, spaced-apart relation, each of said plurality of guide plates having a through hole therein sized to slidably receive said elongate test probe so that said elongate test probe extends through the through hole in each of said plurality of guide plates and so that the first end of said elongate test probe is substantially aligned with the limited-access target on the loaded circuit board when said test fixture is positioned adjacent the loaded circuit board.

3. The test fixture of claim 1, wherein at least one elongate test probe comprises:

4. The test fixture of claim 1, wherein at least one elongate test probe comprises:

5. The test fixture of claim 1, wherein at least one elongate test probe comprises an integral helically coiled section located between the first and second ends of said elongate test probe, the integral helically coiled section biasing the first end of said elongate test probe against the limited-access target on the loaded circuit board when said test fixture is positioned adjacent the loaded circuit board and biasing the second end of said elongate test probe against said contact pad.

6. The test fixture of claim 1, wherein at least one elongate test probe comprises:

7. The test fixture of claim 1, wherein at least one elongate test probe comprises:

8. The test fixture of claim 1, wherein at least one elongate test probe comprises:

9. The test fixture of claim 1, wherein at least one elongate test probe comprises:

10. A test fixture for electrically connecting a plurality of limited-access test targets on a loaded circuit board with a plurality of interface probes of a tester, comprising:

11. The test fixture of claim 10, further comprising a plurality of guide plates positioned in generally parallel, spaced-apart relation, each of said plurality of guide plates having a plurality of through holes therein sized to slidably receive said plurality of elongate test probes so that said plurality of elongate test probes extend through the through holes in each of said plurality of guide plates and so that the first end of each of said plurality of elongate test probe is substantially aligned with a limited-access target on the loaded circuit board when said test fixture is positioned adjacent the loaded circuit board.