Imaging of periodic dielectrics

Research paper by Armin Lechleiter

Indexed on: 11 Feb '10Published on: 11 Feb '10Published in: BIT Numerical Mathematics


We consider imaging of periodic penetrable structures from measurements of scattered electromagnetic waves. The importance of this problem stems from the decreasing size of periodic structures in photonic devices, together with an increasing demand in fast non-destructive testing. This demand makes qualitative inverse scattering techniques particularly attractive since they do not use time consuming optimization techniques for reconstruction but rather directly transform measured data into a picture of the scattering object. We present the Factorization method as an algorithm for imaging of a special class of periodic dielectric structures known as diffraction gratings. Our sampling method computes a picture of the shape of the periodic structure from measured near-field data in a rapid way. We provide numerical examples illustrating this imaging technique.