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High frequency noise calculation in Schottky metal-semiconductor-metal structure and parameter retrieval of nanometric CdTe structure

Research paper by H.Elhadidyabc, F.Z.Mahid, J.Francc, A.Musiienkoc, V.Dedicc, O.Schneeweissa

Indexed on: 15 Nov '17Published on: 01 Jan '18Published in: Thin Solid Films



Abstract

•High-frequency noise in Metal-Semiconductor-Metal Schottky structure is modeled.•The noise of the Au-CdTe-Au structure is calculated for various material parameters.•The noise spectral density due to the leakage current fluctuations is presented.•The noise spectrum exhibits resonance discussed as function of diode parameters.•The results are in agreement with that obtained by Monte Carlo technique.