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Enhancement of spectral-angular density of parametric X-rays in Laue geometry due to change in the angle between a target surface and reflecting atomic planes

Research paper by S. V. Blazhevich, A. V. Noskov

Indexed on: 04 May '08Published on: 04 May '08Published in: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques



Abstract

Coherent X-rays of a relativistic electron crossing a single crystal with a uniform velocity in the Laue scattering geometry are considered in the two-wave approximation of dynamic diffraction theory [1]. Analytical expressions for the spectral-angular distribution of parametric X-rays (PXR) and diffracted transition radiation (DTR) have been obtained. The case when the system of diffracting atomic planes of a crystal is located at an arbitrary angle δ to a crystal surface (asymmetric reflection) is considered. The value δ = π/2 corresponds to the symmetric reflection in the given scattering geometry. The dependence of the PXR and DTR spectral-angular density on the angle δ has been investigated. It has been shown that the PXR spectrum width depends substantially on the given angle, which, in particular, allows one to increase significantly the PXR angular density by decreasing the angle δ.