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Effects of deposition and annealing conditions on the structure and electrical properties of LPCVD silicon thin films

Research paper by S. Das, R. Shriram, K. N. Bhat, P. R. S. Rao

Indexed on: 01 Sep '00Published on: 01 Sep '00Published in: Journal of Materials Science



Abstract

Deposition temperature and annealing conditions have pronounced effects on the structure and electrical properties of LPCVD silicon thin films. Films grown at 580°C are amorphous whereas those grown at 620°C are microcrystalline. All thin films are subjected to phosphorous diffusion followed by different annealing treatments. Annealing of amorphous films at 1000°C results in large grains with no favoured orientation and with a relatively high mobility value. Annealing treatment at 1000°C of the microcrystalline sample results in moderate grain growth with a relatively low mobility which presumably is due to some favoured grain orientation.