Effect of low-temperature annealing and deformation on the structure of metallic glasses by X-ray diffraction

Research paper by Y. Waseda, T. Egami

Indexed on: 01 May '79Published on: 01 May '79Published in: Journal of Materials Science


The changes in the atomic structure of amorphous Pd-Si and Ni-P alloys due to low-temperature annealing, cold-rolling and isothermal creep have been studied by the conventional X-ray diffraction. The present results on the effect of low-temperature annealing were consistent with those of amorphous Fe40Ni40P14B6 alloy studied by the energy dispersive X-ray diffraction method. In addition, the present results have indicated that the effect of cold-rolling causes small changes in the structure of amorphous Pd80Si20 alloy which are qualitatively different from the structural relaxation, and the effect of annealing plays a significant contribution in the structural change during an isothermal creep test.