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Determination of the degree of ordering of materials’ structure by calculating the information-correlation characteristics

Research paper by S. P. Vikhrov, T. G. Avacheva, N. V. Bodyagin, N. V. Grishankina, A. P. Avachev

Indexed on: 18 Apr '12Published on: 18 Apr '12Published in: Semiconductors



Abstract

A new method for the analysis of self-organization processes in solid-state materials by calculating the information-correlation characteristics of a surface (in particular, by calculating the average mutual information) is described. Criteria for determining the degree of ordering of a surface structure are suggested; these criteria have been tested for experimental semiconductor structures of single-, poly-crystalline, and amorphous silicon. The dependences of the information characteristics for films of disordered semiconductors on the technological conditions of their fabrication are established.