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Defectoscopy of ZnGeP 2 single crystals using a strontium vapour laser

Research paper by A I Gribenyukov, S N Podzyvalov, A N Soldatov, A S Shumeiko, N A Yudin, N N Yudin V Yu Yurin

Indexed on: 01 Jun '18Published on: 28 May '18Published in: Quantum electronics



Abstract

A modified method of optical defectoscopy of ZnGeP 2 single crystal plates using a strontium vapour laser (λ = 1.03 and 1.09 μm) is proposed based on shadow imaging of internal defects in plates cut parallel to the (100) plane. It is shown that the use of a strontium vapour laser with a wavelength of 6.45 μm makes it possible to study inhomogeneities in large-size ZnGeP 2 samples. The possibility of fabricating a projection defectoscope for monitoring breakdown development in ZnGeP 2 crystals is considered.