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Atomic-scale study of nanocatalysts by aberration-corrected electron microscopy.

Research paper by Xun X Zhang, Xiuli X Zhang, Biao B Yuan, Chao C Liang, Yi Y Yu

Indexed on: 16 Jul '20Published on: 16 Jul '20Published in: Journal of physics. Condensed matter : an Institute of Physics journal



Abstract

Aberration-corrected electron microscopy (AC-EM) including transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) has become one of the most powerful technologies in the studies of nanocatalysts. With the current spatial resolution of sub-0.5 Å and energy resolution of 10 meV, AC-EM can quantificationally articulate the connection between catalytic properties and atomic configurations of nanocatalysts. However, the restricted irradiation sensitive characteristics of specimens pose an obstacle to solve their intrinsic structure. Low-dose imaging should be applied to overcome this problem. In addition, the choice of appropriate imaging method is also crucial to tackle specific structural problems of nanocatalysts. On the basis of careful management of electron dose and selection of suitable imaging method, in situ gas and liquid S/TEM are able to reveal the structure evolution of nanocatalysts in real-time. Further combination with residual gas analysis would deepen the understanding of the catalytic reaction.